PCIE VERIFICATION AT HIGH SPEEDS: CHALLENGES, SOLUTIONS, AND FUTURE TRENDS

Authors

  • Deepak Kumar Lnu Principal Engineer, USA. Author

DOI:

https://doi.org/10.34218/IJCET_16_01_274

Keywords:

PCIe Verification, PAM4, FLITS, FEC, L0p, Signal Integrity, Artificial Intelligence, Automotive Safety, High-Performance Computing

Abstract

PCI Express (PCIe) technology is a cornerstone of high-speed data transfer, driving innovation across numerous modern applications. This article delves into the increasingly complex landscape of PCIe verification, specifically addressing the unique challenges presented by advanced features in PCIe 6.0 and PCIe 7.0, such as Pulse Amplitude Modulation 4 (PAM4) signaling, Flow Control Units (FLITs), Forward Error Correction (FEC), and intricate power management states like L0p. We examine the critical aspects of protocol verification, signal integrity validation, and system-level integration, highlighting the growing difficulties in ensuring reliable operation at unprecedented data rates. To tackle these challenges, this paper presents comprehensive solutions, including advanced verification methodologies, error injection techniques, and the strategic application of artificial intelligence and machine learning (AI/ML) to automate and optimize verification processes. Furthermore, the article explores the implications of PCIe verification in critical domains such as high-performance computing, automotive systems, and large-scale data centers, emphasizing the necessity of robust verification frameworks to ensure stable and efficient operation. Looking to the future, we discuss the transformative potential of AI/ML, which is poised to revolutionize PCIe verification, enabling more efficient and thorough validation of increasingly complex systems. This paper aims to provide valuable insights and practical guidance for engineers and researchers working in high-speed interconnect verification.

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Published

2025-02-28

How to Cite

Deepak Kumar Lnu. (2025). PCIE VERIFICATION AT HIGH SPEEDS: CHALLENGES, SOLUTIONS, AND FUTURE TRENDS. INTERNATIONAL JOURNAL OF COMPUTER ENGINEERING AND TECHNOLOGY, 16(01), 3987-4016. https://doi.org/10.34218/IJCET_16_01_274