GAUTAM NANDKISHORE NAYAK. ELECTRONICS MANUFACTURING TESTING: A TECHNICAL DEEP DIVE. INTERNATIONAL JOURNAL OF COMPUTER ENGINEERING AND TECHNOLOGY, [S. l.], v. 16, n. 01, p. 253–262, 2025. Disponível em: https://ijcet.in/index.php/ijcet/article/view/203.. Acesso em: 22 jun. 2025.