PRATHIPA. A NOVEL APPROACH TO FUNCTIONAL VERIFICATION CLOSURE USING OPTIMAL TEST SCENARIOS IN DIGITAL CIRCUITS. INTERNATIONAL JOURNAL OF COMPUTER ENGINEERING AND TECHNOLOGY, [S. l.], v. 15, n. 4, p. 85–91, 2024. Disponível em: https://ijcet.in/index.php/ijcet/article/view/IJCET_15_04_007.. Acesso em: 4 feb. 2026.