SRINIVASA RAO VEMULA. EXPLORING CHALLENGES AND OPPORTUNITIES IN TEST AUTOMATION FOR IOT DEVICES AND SYSTEMS. INTERNATIONAL JOURNAL OF COMPUTER ENGINEERING AND TECHNOLOGY, [S. l.], v. 15, n. 4, p. 39–52, 2024. Disponível em: https://ijcet.in/index.php/ijcet/article/view/IJCET_15_04_004.. Acesso em: 25 mar. 2026.